8 article(s) from Hlawacek, Gregor

Scanning transmission imaging in the helium ion microscope using a microchannel plate with a delay line detector

  • Eduardo Serralta,
  • Nico Klingner,
  • Olivier De Castro,
  • Michael Mousley,
  • Santhana Eswara,
  • Serge Duarte Pinto,
  • Tom Wirtz and
  • Gregor Hlawacek

Beilstein J. Nanotechnol. 2020, 11, 1854–1864, doi:10.3762/bjnano.11.167

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Published 11 Dec 2020

Imaging and milling resolution of light ion beams from helium ion microscopy and FIBs driven by liquid metal alloy ion sources

  • Nico Klingner,
  • Gregor Hlawacek,
  • Paul Mazarov,
  • Wolfgang Pilz,
  • Fabian Meyer and
  • Lothar Bischoff

Beilstein J. Nanotechnol. 2020, 11, 1742–1749, doi:10.3762/bjnano.11.156

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Published 18 Nov 2020

An atomic force microscope integrated with a helium ion microscope for correlative nanoscale characterization

  • Santiago H. Andany,
  • Gregor Hlawacek,
  • Stefan Hummel,
  • Charlène Brillard,
  • Mustafa Kangül and
  • Georg E. Fantner

Beilstein J. Nanotechnol. 2020, 11, 1272–1279, doi:10.3762/bjnano.11.111

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Published 26 Aug 2020

Stationary beam full-field transmission helium ion microscopy using sub-50 keV He+: Projected images and intensity patterns

  • Michael Mousley,
  • Santhana Eswara,
  • Olivier De Castro,
  • Olivier Bouton,
  • Nico Klingner,
  • Christoph T. Koch,
  • Gregor Hlawacek and
  • Tom Wirtz

Beilstein J. Nanotechnol. 2019, 10, 1648–1657, doi:10.3762/bjnano.10.160

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Published 07 Aug 2019

Site-controlled formation of single Si nanocrystals in a buried SiO2 matrix using ion beam mixing

  • Xiaomo Xu,
  • Thomas Prüfer,
  • Daniel Wolf,
  • Hans-Jürgen Engelmann,
  • Lothar Bischoff,
  • René Hübner,
  • Karl-Heinz Heinig,
  • Wolfhard Möller,
  • Stefan Facsko,
  • Johannes von Borany and
  • Gregor Hlawacek

Beilstein J. Nanotechnol. 2018, 9, 2883–2892, doi:10.3762/bjnano.9.267

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Published 16 Nov 2018

Digging gold: keV He+ ion interaction with Au

  • Vasilisa Veligura,
  • Gregor Hlawacek,
  • Robin P. Berkelaar,
  • Raoul van Gastel,
  • Harold J. W. Zandvliet and
  • Bene Poelsema

Beilstein J. Nanotechnol. 2013, 4, 453–460, doi:10.3762/bjnano.4.53

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Published 24 Jul 2013

Imaging ultra thin layers with helium ion microscopy: Utilizing the channeling contrast mechanism

  • Gregor Hlawacek,
  • Vasilisa Veligura,
  • Stefan Lorbek,
  • Tijs F. Mocking,
  • Antony George,
  • Raoul van Gastel,
  • Harold J. W. Zandvliet and
  • Bene Poelsema

Beilstein J. Nanotechnol. 2012, 3, 507–512, doi:10.3762/bjnano.3.58

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Published 12 Jul 2012

Channeling in helium ion microscopy: Mapping of crystal orientation

  • Vasilisa Veligura,
  • Gregor Hlawacek,
  • Raoul van Gastel,
  • Harold J. W. Zandvliet and
  • Bene Poelsema

Beilstein J. Nanotechnol. 2012, 3, 501–506, doi:10.3762/bjnano.3.57

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Published 10 Jul 2012
 
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